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system circuit test

См. также в других словарях:

  • In-circuit test — (ICT) is an example of white box testing where an electrical probe tests a populated printed circuit board (PCB), checking for shorts, opens, resistance, capacitance, and other basic quantities which will show whether the assembly was correctly… …   Wikipedia

  • Test engineer — A (hardware) test engineer (TE) is a professional who determines how to create a process that would test a particular product in manufacturing, or related area like RMA department, in order to guarantee that the product will be shipped out with… …   Wikipedia

  • Circuit integrity — fireproofing of cable trays in Lingen/Ems, Germany using calcium silicate board system qualified to DIN 4102 …   Wikipedia

  • System Architecture Evolution — (aka SAE) is the core network architecture of 3GPP s LTE wireless communication standard. SAE is the evolution of the GPRS Core Network, with some differences: simplified architecture all IP Network (AIPN) support for higher throughput and lower… …   Wikipedia

  • Circuit Showdown — Category Auto Racing Series Country or region Philippines Inaugural season 2010 Official website …   Wikipedia

  • Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… …   Wikipedia

  • Circuit Paul Ricard — Die 1970 eröffnete 5,81 km lange Strecke (später hinzugefügte Teile sind grau gezeichnet) Der Circuit Paul Ricard ist eine 1970 fertiggestellte Motorsport Rennstrecke nahe der südfranzösischen Ortschaft Le Castellet im Département Var; etwa… …   Deutsch Wikipedia

  • Circuit design — The process of circuit design can cover systems ranging from complex electronic systems all the way down to the individual transistors within an integrated circuit. For simple circuits the design process can often be done by one person without… …   Wikipedia

  • Test and Test-and-set — In computer science, the test and set CPU instruction is used to implement mutual exclusion in multiprocessor environments. Although a correct lock can be implemented with test and set, it can lead to memory contention in busy lock (caused by bus …   Wikipedia

  • Printed circuit board — Part of a 1983 Sinclair ZX Spectrum computer board; a populated PCB, showing the conductive traces, vias (the through hole paths to the other surface), and some mounted electrical components A printed circuit board, or PCB, is used to… …   Wikipedia

  • Joint Test Action Group — (JTAG) is the usual name used for the IEEE 1149.1 standard entitled Standard Test Access Port and Boundary Scan Architecture for test access ports used for testing printed circuit boards using boundary scan.JTAG was an industry group formed in… …   Wikipedia

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